THERMOELECTRICS
- can measure or determine the resistivity, Seebeck coefficient, ZT value and Hall coefficient
- and gives you information about a conversion of waste heat into electrical energy and the quality of the thermoelectric material.
Devices:
TEG-TESTER
- Measuring system for temperature-dependent efficiency evaluation of thermoelectric generators (TEGs)
- Temperature range: RT to 300°C / -20 to 300°C
LSR-3
- Measurement of Seebeck coefficient and electrical conductivity on solid materials and thin films
- Temperature range: -100 to 500°C / RT to 800/1100/1500°C
LZT-METER
- Combined LFA+LSR
- Measurement of Seebeck coefficient, resistivity and thermal conductivity
- Temperature range: -100 to 500°C / RT to 800/1100°C
- For a complete ZT measurement
HCS 1/10/100
- Characterization of semiconductor devices
- Measures charge carrier mobility, resistivity, charge carrier concentration and Hall constant
- Temperature range: LN2 to 800°C / RT to 500°C
TFA
- Complete ZT characterization on thin films from nm to µm range
- Optional measurement of Hall coefficient, carrier density and mobility
- Temperature range: -170/RT to 280°C
TF-LFA
- Time Domain Thermoreflectance (TDTR)
- Measurement of the thermal diffusivity of thin films
- Temperature range: -100/RT to 500°C
Links:
Product brochure as PDF:
Video:
Linseis Thermoelectric devices - Basics (Webinar 2019)
Application examples:
LSR – Copper – Electric conductivity TFA – thermoelectric thin film – thermoelectric properties – metals&alloys
